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Volumn 95, Issue 16, 2009, Pages

10 μm minority-carrier diffusion lengths in Si wires synthesized by Cu-catalyzed vapor-liquid-solid growth

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; CARRIER DIFFUSION LENGTH; GROWTH PROCESS; HIGH EFFICIENCY; PHOTOGENERATED CARRIERS; SURFACE PASSIVATION; SURFACE RECOMBINATIONS; SURFACE STATE; VAPOR-LIQUID-SOLID GROWTH;

EID: 70350431281     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3247969     Document Type: Article
Times cited : (78)

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  • 9
    • 70350427123 scopus 로고    scopus 로고
    • See EPAPS supplementary material at E-APPLAB-95-070941 for further information on device fabrication, characterization, and analysis.
    • See EPAPS supplementary material at http://dx.doi.org/10.1063/1.3247969 E-APPLAB-95-070941 for further information on device fabrication, characterization, and analysis.
  • 10
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  • 14
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    • Influence of surface states on electron transport through intrinsic Ge nanowires
    • DOI 10.1021/jp044491b
    • T. Hanrath and B. A. Korgel, J. Phys. Chem. B 1089-5647 109, 5518 (2005). 10.1021/jp044491b (Pubitemid 40519451)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.