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Volumn 11, Issue 6, 2011, Pages 5279-5284
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In-situ monitoring of pattern filling in nano-imprint lithography using surface plasmon resonance
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Author keywords
Filling rate; Imprint lithography; Monitoring; Nanoimprint; Surface plasmon resonance (SPR)
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Indexed keywords
ANGLE SHIFTS;
DETRIMENTAL EFFECTS;
END POINTS;
FILLING IN;
FILLING RATE;
GLASS LAYERS;
HIGH REFRACTIVE INDEX;
HIGH SENSITIVITY;
HIGH THROUGHPUT;
IMPRINT LITHOGRAPHY;
IMPRINTED POLYMERS;
IN-SITU MONITORING;
INNOVATIVE METHOD;
LOW COSTS;
LOW REFRACTIVE INDEX;
METAL THIN FILM;
MOLD FILLING;
MONITORING SYSTEM;
NANO-IMPRINT;
REFLECTIVITY CHANGES;
RESONANCE ANGLE;
FILLING;
GLASS;
MOLDS;
MONITORING;
NANOIMPRINT LITHOGRAPHY;
REFRACTIVE INDEX;
SURFACE PLASMON RESONANCE;
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EID: 84861175710
PISSN: 15334880
EISSN: 15334899
Source Type: Journal
DOI: 10.1166/jnn.2011.3780 Document Type: Conference Paper |
Times cited : (8)
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References (15)
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