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Volumn 11, Issue 6, 2011, Pages 5279-5284

In-situ monitoring of pattern filling in nano-imprint lithography using surface plasmon resonance

Author keywords

Filling rate; Imprint lithography; Monitoring; Nanoimprint; Surface plasmon resonance (SPR)

Indexed keywords

ANGLE SHIFTS; DETRIMENTAL EFFECTS; END POINTS; FILLING IN; FILLING RATE; GLASS LAYERS; HIGH REFRACTIVE INDEX; HIGH SENSITIVITY; HIGH THROUGHPUT; IMPRINT LITHOGRAPHY; IMPRINTED POLYMERS; IN-SITU MONITORING; INNOVATIVE METHOD; LOW COSTS; LOW REFRACTIVE INDEX; METAL THIN FILM; MOLD FILLING; MONITORING SYSTEM; NANO-IMPRINT; REFLECTIVITY CHANGES; RESONANCE ANGLE;

EID: 84861175710     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2011.3780     Document Type: Conference Paper
Times cited : (8)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.