In-plane liquid crystalline texture of high-performance thienothiophene copolymer thin films

Advanced Functional Materials

Volumn 20, Issue 23, 2010, Pages 4098-4106

  Zhang, Xinran ^a   Hudson, Steven D ^a   Delongchamp, Dean M ^a   Gundlach, David J ^b   Heeney, Martin ^c   McCulloch, Iain ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

crystal orientation; organic thin film transistors; thienothiophene copolymers; transmission electron microscopy

Indexed keywords

CARRIER HOPPING; CHARGE TRANSPORT; COPOLYMER THIN FILMS; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPY; DOMAIN SIZE; GRAIN SIZE; GRAIN STRUCTURES; HIGH CRYSTALLINITY; IN-PLANE; LENGTH SCALE; LIQUID-CRYSTALLINE; LOW DENSITY; ORGANIC THIN FILM TRANSISTORS; POLYMER SEMICONDUCTORS; PROCESSABLE; SMALL MOLECULES; TEM; THIENOTHIOPHENES; TRANSMISSION ELECTRON;

ACTIVATION ENERGY; AMORPHOUS SILICON; CARRIER MOBILITY; COPOLYMERIZATION; COPOLYMERS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; LIQUIDS; ORGANIC POLYMERS; POLYCRYSTALLINE MATERIALS; POLYMERS; SOIL CONSERVATION; SURFACE TOPOGRAPHY; TEXTURES; THIN FILM TRANSISTORS; THIN FILMS; THIOPHENE; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL ORIENTATION;

EID: 78650128837     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201001232     Document Type: Article

References (45)

1. V. Coropceanu, J. Cornil, D. A. da Silva Filho, Y. Olivier, R. Silbey, J.-L. Brédas, Chem. Rev. 2007, 107, 926.
2. a) M. L. Chabinyc, A. Salleo, Chem. Mater. 2004, 16, 4509
3. b) G. Horowitz, J. Mater. Res. 2004, 19, 1946
4. c) P. W. M. Blom, V. D. Mihailatchi, L. J. A. Koster, D. E. Markov, Adv. Mater. 2007, 19, 1551
5. d) Y.-L. Loo, I. McCulloch, MRS Bull. 2008, 33, 653.
6. R. A. Street, J. E. Northrup, A. Salleo, Phys. Rev. B 2005, 71, 165202.
7. a) C. C. Mattheus, A. B. Dros, J. Baas, G. T. Oostergetel, A. Meetsma, J. L. de Boer, T. T. M. Palstra, Synth. Met. 2003, 138, 475
8. b) S. E. Fritz, S. M. Martin, C. D. Frisbie, M. D. Ward, M. F. Toney, J. Am. Chem. Soc. 2004, 126, 4084
9. c) R. Ruiz, D. Choudhary, B. Nickel, T. Toccoli, K.-C. Chang, A. C. Mayer, P. Clancy, J. M. Blakely, R. L. Headrick, S. Iannotta, G. G. Malliaras, Chem. Mater. 2004, 16, 4497
10. d) R. Ruiz, A. Papadimitratos, A. C. Mayer, G. G. Malliaras, Adv. Mater. 2005, 17, 1795
11. e) M. Kitamura, Y. Arakawa, J. Phys.: Condens. Matter 2008, 20, 184011.
12. a) Z. Bao, A. Dodabalapur, A. J. Lovinger, Appl. Phys. Lett. 1996, 69, 4108
13. b) H. Sirringhaus, P. J. Brown, R. H. Friend, M. M. Nielsen, K. Bechgaard, B. M. W. Langeveld-Voss, A. J. H. Spiering, R. A. J. Janssen, E. W. Meijer, P. Herwig, D. M. de Leeuw, Nature 1999, 401, 685
14. c) B. Grévin, P. Rannou, R. Payerne, A. Pron, J.-P. Travers, Adv. Mater. 2003, 15, 881
15. d) D. M. DeLongchamp, B. M. Vogel, Y. Jung, M. C. Gurau, C. A. Richter, O. A. Kirillov, J. Obrzut, D. A. Fischer, S. Sambasivan, L. J. Richter, E. K. Lin, Chem. Mater. 2005, 17, 5610
16. e) R. J. Kline, M. D. McGehee, E. N. Kadnikova, J. Liu, J. M. J. Fréchet, M. F. Toney, Macromol. 2005, 38, 3312.
17. a) G. Horowitz, M. E. Hajlaoui, Adv. Mater. 2000, 12, 1046
18. b) Horowitz, M. E. Hajlaoui, Synth. Met. 2001, 122, 185
19. c) A. Di Carlo, F. Piacenza, A. Bolognesi, B. Stadlober, H. Maresch, Appl. Phys. Lett. 2005, 86, 263501
20. d) S. S. Lee, C. S. Kim, E. D. Gomez, B. Purushothuman, M. F. Toney, C. Wang, A. Hexemer, J. E. Anthony, Y.-L. Loo, Adv. Mater. 2009, 21, 3605
21. e) L. H. Jimison, M. F. Toney, I. McCulloch, M. Heeney, A. Salleo, Adv. Mater. 2009, 21, 1568.
22. a) K. Puntambekar, J. Dong, G. Haugstad, C. D. Frisbie, Adv. Funct. Mater. 2006, 16, 879
23. b) V. Kalihari, E. B. Tadmor, G. Haugstad, C. D. Frisbie, Adv. Mater. 2008, 20, 1.
24. a) I. McCulloch, M. Heeney, C. Bailey, K. Genevicius, I. McDonald, M. Shkunov, D. Sparrowe, S. Tierney, R. Wagner, W. Zhang, M. L. Chabinyc, R. J. Kline, M. D. McGehee, M. F. Toney, Nat. Mater. 2006, 5, 328
25. b) D. M. DeLongchamp, R. J. Kline, E. K. Lin, D. A. Fischer, L. J. Richter, L. A. Lucas, M. Heeney, I. McCulloch, J. E. Northrup, Adv. Mater. 2007, 19, 833
26. c) B. H. Hamadani, D. J. Gundlach, I. McCulloch, M. Heeney, Appl. Phys. Lett. 2007, 91, 243512
27. d) R. J. Kline, D. M. DeLongchamp, D. A. Fischer, E. K. Lin, M. Heeney, I. McCulloch, M. F. Toney, Appl. Phys. Lett. 2007, 90, 062117
28. e) D. M. DeLongchamp, R. J. Kline, Y. Jung, E. K. Lin, D. A. Fischer, D. J. Gundlach, S. K. Cotts, A. J. Moad, L. J. Richter, M. F. Toney, M. Heeney, I. McCulloch, Macromolecules 2008, 41, 5709
29. f) M. L. Chabinyc, M. F. Toney, R. J. Kline, I. McCulloch, M. Heeney, J. Am. Chem. Soc. 2007, 129, 3226
30. g) D. M. DeLongchamp, R. J. Kline, Y. Jung, D. S. Germack, E. K. Lin, A. J. Moad, L. J. Richter, M. F. Toney, M. Heeney, I. McCulloch, ACS Nano 2009, 3, 780.
31. D. B. Williams, C. B. Carter, in Transmission Electron Microscopy, Vol. 1, Plenum Press, New York 1996, Ch. 9.
32. E. S. Sherman, W. W. Adams, E. L. Thomas, J. Mater. Sci. 1981, 16, 1.
33. J. Petermann, H. Moritz, U. Rieck, B. A. Wood, E. L. Thomas, J. Mater. Sci. 1989, 8, 1023.
34. S. Kumar, W. W. Adams, Polymer 1990, 31, 15.
35. L. Reimer, Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, Springer-Verlag, Berlin 1993.
36. S. Chandrasekhar, Liquid Crystals, University Press, Cambridge 1977.
37. a) C. Kübel, L. GonzálezRonda, L. F. Drummy, D. C. Martin, J. Phys. Org. Chem. 2000, 13, 816
38. b) L. GonzálezRonda, D. C. Martin, Macromol. 2004, 37, 2872.
39. a) A. M. Donald, A. H. Windle, J. Mater. Sci. 1983, 18, 1143
40. b) E. L. Thomas, B. A. Wood, Faraday. Discuss. Chem. Soc. 1985, 79, 229
41. c) B. A. Wood, E. L. Thomas, Nature 1986, 324, 655
42. d) S. D. Hudson, E. L. Thomas, Phys. Rev. Lett. 1989, 62, 1993
43. e) S. D. Hudson, E. L. Thomas, Phys. Rev. A 1991, 44, 8128.
44. S. Tierney, I. McCulloch, Synth. Met. 2005, 148, 195.
45. NIST disclaimer: Certain commercial equipment, instruments or materials are identified in this paper in order to adequately specify the experimental details. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology nor does it imply the materials or equipment identified are necessarily the best available for this purpose.