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Volumn 547, Issue , 2012, Pages 110-119
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Microstructure and impression creep behavior of lead-free Sn-5Sb solder alloy containing Bi and Ag
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Author keywords
Impression creep; Lead free solder; Sn Sb alloy
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Indexed keywords
ACTIVATION ENERGY;
ANTIMONY ALLOYS;
BISMUTH ALLOYS;
CREEP;
CREEP RESISTANCE;
CREEP TESTING;
GRAIN BOUNDARIES;
LEAD ALLOYS;
LEAD-FREE SOLDERS;
SILVER ALLOYS;
TIN ALLOYS;
BASE ALLOYS;
CREEP BEHAVIORS;
DISLOCATION CLIMB;
HIGH STRESS;
IMPRESSION CREEP;
LEAD-FREE;
LOWER STRESS;
SOLDER ALLOYS;
STRESS EXPONENTS;
STRESS REGIME;
BINARY ALLOYS;
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EID: 84860343849
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2012.03.093 Document Type: Article |
Times cited : (58)
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References (41)
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