Atomic-resolution defect contrast in low angle annular dark-field STEM

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 47-55

  Phillips, P J ^a   De Graef, M ^b   Kovarik, L ^c   Agrawal, A ^d   Windl, W ^d   Mills, M J ^d  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d Ohio State University   (United States)

Author keywords

ADF STEM; Atomic resolution; Crystalline defects; Low angle annular dark field

Indexed keywords

ACCEPTANCE ANGLE; ADF-STEM; ANNULAR DETECTORS; ATOMIC RESOLUTION; COMPUTATIONAL RESULTS; CRYSTALLINE DEFECTS; DARK-FIELD; DEFECT CONTRAST; HIGH RESOLUTION; IMAGE DEFECTS; IMAGING MODES; LENGTH SCALE; MICROSCOPE CAMERAS; SCATTERED ELECTRONS; ZONE AXIS;

IMAGE QUALITY;

ATOMS;

ARTICLE; CONTRAST ENHANCEMENT; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; MOLECULAR DYNAMICS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84859934678     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.013     Document Type: Article

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