Annular dark-field image simulation of the YBa2Cu3O(7-δ)/BaF2 interface

Ultramicroscopy

Volumn 84, Issue 1-2, 2000, Pages 65-74

  Lee, J L ^a   Silcox, J ^a  

^a Cornell University   (United States)

Author keywords

Dislocations; High T(c) superconductors; Interface structure; Scanning transmission electron microscopy (STEM)

Indexed keywords

BAND STRUCTURE; BARIUM COMPOUNDS; COMPUTER SIMULATION; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); HIGH TEMPERATURE SUPERCONDUCTORS; IMAGE ANALYSIS; OXIDE SUPERCONDUCTORS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

ANNULAR DARK-FIELDS (ADF); BARIUM FLUORIDE;

INTERFACES (MATERIALS);

BARIUM DERIVATIVE; BARIUM FLUORIDE; COPPER COMPLEX; UNCLASSIFIED DRUG; YTTRIUM;

ARTICLE; CRYSTAL; DISLOCATION; FILM; IMAGE ANALYSIS; IMAGE PROCESSING; MODEL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034119086     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00020-6     Document Type: Article

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