Diffraction contrast STEM of dislocations: Imaging and simulations

Ultramicroscopy

Volumn 111, Issue 9-10, 2011, Pages 1483-1487

  Phillips, P J ^a   Brandes, M C ^a   Mills, M J ^a   de Graef, M ^b  

^a Ohio State University   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Defect imaging; Diffraction contrast; Image simulation; STEM

Indexed keywords

CONVENTIONAL TEM; CRYSTALLINE DEFECTS; DEFECT ANALYSIS; DEFECT IMAGING; DIFFRACTION CONTRAST; IMAGE SIMULATIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STEM; ZONE AXIS;

DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

SCREW DISLOCATIONS;

ARTICLE; CONTRAST; ELECTRON DIFFRACTION; EXPERIMENTAL STUDY; IMAGE DISPLAY; IMAGE PROCESSING; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; SOLID;

COMPUTER SIMULATION; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 84860389158     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.07.001     Document Type: Article

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