SCOPUS 정보 검색 플랫폼

Volumn 318, Issue 1, 2011, Pages 1151-1156

A new insight on crystalline strain and defect features by STEMADF imaging

a CNR (Italy)

Author keywords

A1. Annular Dark Field; A1. Defects; A1. Electron microscopy; A1. Quantum Dots; A3. Nanowires; B2. Semiconducting materials

Indexed keywords

A1. DEFECTS; A1. ELECTRON MICROSCOPY; A1. QUANTUM DOTS; A3. NANOWIRES; DARK FIELD; SEMICONDUCTING MATERIALS;

CHARACTERIZATION; CHEMICAL ANALYSIS; DEFECTS; DISLOCATIONS (CRYSTALS); NANOWIRES; SEMICONDUCTOR QUANTUM DOTS;

CRYSTAL ORIENTATION;

EID: 79952739351 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.10.180 Document Type: Conference Paper

Times cited : (33)

References (18)

1
- 0033011329
- P.D. Nellist, and S.J. Pennycook Ultramicroscopy 78 1999 111
- (1999) Ultramicroscopy , vol.78 , pp. 111
- Nellist, P.D.¹ Pennycook, S.J.²

2
- 0034929843
- B. Raferty, P. Nellist, and S.J. Pennycook Journal of Electron Microscopy 50 2001 227
- (2001) Journal of Electron Microscopy , vol.50 , pp. 227
- Raferty, B.¹ Nellist, P.² Pennycook, S.J.³

3
- 0038163517
- P.M. Voyles, J.L. Grazul, and D.A. Muller Ultramicroscopy 96 2003 251
- (2003) Ultramicroscopy , vol.96 , pp. 251
- Voyles, P.M.¹ Grazul, J.L.² Muller, D.A.³

4
- 40749111049
- V. Grillo, E. Carlino, and F. Glas Physical Review B 77 2008 054103
- (2008) Physical Review B , vol.77 , pp. 054103
- Grillo, V.¹ Carlino, E.² Glas, F.³

5
- 0027714798
- D.D. Perovic, C.J. Rossouw, and A. Howie Ultramicroscopy 52 1993 353
- (1993) Ultramicroscopy , vol.52 , pp. 353
- Perovic, D.D.¹ Rossouw, C.J.² Howie, A.³

6
- 0030875192
- A. Amali, P. Rez, and M. Cowley Micron 28 1997 89
- (1997) Micron , vol.28 , pp. 89
- Amali, A.¹ Rez, P.² Cowley, M.³

7
- 0035099821
- C.P. Liu, R.D. Twesten, and J.M. Gibson Ultramicroscopy 87 2001 79
- (2001) Ultramicroscopy , vol.87 , pp. 79
- Liu, C.P.¹ Twesten, R.D.² Gibson, J.M.³

8
- 70349970631
- V. Grillo Ultramicroscopy 109 2009 1453
- (2009) Ultramicroscopy , vol.109 , pp. 1453
- Grillo, V.¹

9
- 70349941846
- J. Broeckx, M. Op de Beeck, and D. van Dyck Ultramicroscopy 60 1996 71
- (1996) Ultramicroscopy , vol.60 , pp. 71
- Broeckx, J.¹ Op De Beeck, M.² Van Dyck, D.³

10
- 0028010790
- Z.L. Wang Ultramicroscopy 53 1994 73
- (1994) Ultramicroscopy , vol.53 , pp. 73
- Wang, Z.L.¹

11
- 0029278184
- S. Hillyard, and J. Silcox Ultramicroscopy 58 1995 6
- (1995) Ultramicroscopy , vol.58 , pp. 6
- Hillyard, S.¹ Silcox, J.²

12
- 1942521243
- Z. Yu, D.A. Muller, and J. Silcox Journal of Applied Physics 95 2004 3362
- (2004) Journal of Applied Physics , vol.95 , pp. 3362
- Yu, Z.¹ Muller, D.A.² Silcox, J.³

15
- 51349164731
- F. Jabeen, S. Rubini, V. Grillo, L. Felisari, and F. Martelli Applied Physics Letters 93 2008 083117
- (2008) Applied Physics Letters , vol.93 , pp. 083117
- Jabeen, F.¹ Rubini, S.² Grillo, V.³ Felisari, L.⁴ Martelli, F.⁵

16
- 0003598030
- Butterworths/Krieger London/Malabar FL
- P. Hirsch, A. Howie, R. Nicholson, D.W. Pashley, and M.J. Whelan Electron Microscopy of Thin Crystals 1965/1977 Butterworths/Krieger London/Malabar FL
- (1965) Electron Microscopy of Thin Crystals
- Hirsch, P.¹ Howie, A.² Nicholson, R.³ Pashley, D.W.⁴ Whelan, M.J.⁵

17
- 27744496206
- Institute of Physics
- G. Salviati, F. Rossi, N. Armani, L. Lazzarini, L. Nasi, V. Grillo, A. Passaseo, R. Cingolani, M. Longo, O. Martinez, Institute of Physics, Conference Series, vol. 169, 2001, pp. 251254.
- (2001) Conference Series , vol.169 , pp. 251-254
- Salviati, G.¹ Rossi, F.² Armani, N.³ Lazzarini, L.⁴ Nasi, L.⁵ Grillo, V.⁶ Passaseo, A.⁷ Cingolani, R.⁸ Longo, M.⁹ Martinez, O.¹⁰

18
- 0003531591
- McGraw-Hill New York
- J.P. Hirth, and J. Lothe Theory of Dislocations 1968 McGraw-Hill New York
- (1968) Theory of Dislocations
- Hirth, J.P.¹ Lothe, J.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.