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Ultramicroscopy

Volumn 87, Issue 1-2, 2001, Pages 79-88

High-angle annular dark-field imaging of self-assembled Ge islands on Si(001)

(3) Liu, Chuan Pu a,c Twesten, R D a Gibson, J Murray b

a University of Illinois at Urbana Champaign (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

Author keywords

Ge Si; HAADF; Quantum dot; Strain field

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; IMAGE ANALYSIS; MODEL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; THEORY;

EID: 0035099821 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(00)00059-0 Document Type: Article

Times cited : (22)

References (24)

1
- 0032535998
- (1998) Science , vol.279 , pp. 353
- Medeiros-Ribeiro, G.¹ Bratkovski, A.M.² Kamins, T.I.³ Ohlberg, D.A.A.⁴ Williams, R.S.⁵

2
- 4344708593
- (1998) Phys. Rev. Lett. , vol.80 , pp. 984
- Ross, F.M.¹ Tersoff, J.² Tromp, R.M.³

3
- 5444230424
- (1995) Phys. Rev. Lett. , vol.75 , pp. 2968
- Shchukin, V.A.¹ Ledentsov, N.N.² Kopev, P.S.³ Bimberg, D.⁴

4
- 0003313658
- (1999) Appl. Phys. Lett. , vol.75 , pp. 46
- Miller, P.D.¹ Liu, C.P.² Henstrom, W.M.³ Gibson, J.M.⁴ Huang, Y.⁵ Zhang, P.⁶ Kamins, T.I.⁷ Basile, D.P.⁸ Williams, R.S.⁹

5
- 0013143858
- Siegel B.M., Beamam D.R. (Eds.), Physical Aspects of Electron Microscopy and Microbeam Analysis, New York: Wiley
- (1975) , pp. 47
- Crewe, A.V.¹ Langmore, J.P.² Isaacson, M.S.³

6
- 84985232941
- (1986) J. Microsc. , vol.144 , pp. 229
- Pennycook, S.J.¹ Berger, S.D.² Cullbertson, R.J.³

7
- 0033005719
- (1999) J. Microscopy , vol.194 , pp. 171-182
- Liu, C.P.¹ Preston, A.R.² Boothroyd, C.B.³ Humphreys, C.J.⁴

8
- 0032666386
- (1999) Jap. J. Appl. Phys. , vol.38
- Saitoh, K.¹ Tsuda, K.² Tanaka, M.³ Tsai, A.P.⁴

9
- 0032472969
- (1998) Acta Mater. , vol.46 , pp. 1801
- Dickey, E.C.¹ Dravid, V.P.² Nellist, P.D.³ Wallis, D.J.⁴ Pennycook, S.J.⁵

10
- 0033079327
- (1999) J. Am. Ceram. Soc. , vol.82 , pp. 366
- Browning, N.D.¹ Buban, J.P.² Moltaji, H.O.³ Duscher, G.⁴

11
- 85022194244

12
- 85022199227

13
- 0024122676
- (1988) Ultramicroscopy , vol.26 , pp. 133
- Treacy, M.M.J.¹ Gibson, J.M.² Short, K.T.³ Rice, S.B.⁴

14
- 0027714798
- (1993) Ultramicroscopy , vol.52 , pp. 353
- Perovic, D.D.¹ Rossouw, C.J.² Howie, A.³

15
- 0022028887
- (1985) Philos. Mag. , vol.51 A , pp. 389
- Treacy, M.M.J.¹ Gibson, J.M.² Howie, A.³

16
- 0000326270
- (1999) J. Appl. Phys. , vol.85 , pp. 1159
- Kamins, T.I.¹ Medeiros-Ribeiro, G.² Ohlberg, D.A.A.³ Williams, R.S.⁴

17
- 0027670012
- (1993) Ultramicroscopy , vol.52 , pp. 31
- Treacy, M.M.J.¹ Gibson, J.M.²

18
- 0026202777
- (1991) Ultramicroscopy , vol.37 , pp. 14
- Pennycook, S.J.¹ Jesson, D.E.²

19
- 0027545078
- (1993) Ultramicrscopy , vol.49 , pp. 14
- Hillyard, S.¹ Loane, R.F.² Silcox, J.³

20
- 0030979935
- (1997) J. Electron Microsc. , vol.46 , pp. 33
- Nakamura, K.¹ Kakibayashi, H.² Kanehori, K.³ Tanaka, N.⁴

21
- 85022217217

22
- 84980074290
- (1968) Acta Crys. , vol.24 A , pp. 390
- Doyle, P.A.¹ Turner, P.S.²

23
- 85022220451

24
- 0026816717
- (1992) Ultramicroscopy , vol.40 , pp. 121
- Loane, R.F.¹ Xu, P.² Silcox, J.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.