Systematic row and zone axis STEM defect image simulations

Philosophical Magazine

Volumn 91, Issue 16, 2011, Pages 2081-2101

  Phillips, P J ^a   Mills, M J ^a   De Graef, M ^b  

^a The Ohio State University   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Defects in solids; Electron diffraction; Image simulation; Stacking fault; STEM

Indexed keywords

BEAM DIVERGENCE ANGLES; BRIGHT FIELDS; COMPUTATIONAL RESULTS; CONVENTIONAL TEM; CRYSTALLINE DEFECTS; DARK FIELD; DEFECT ANALYSIS; DEFECTS IN SOLIDS; DIFFRACTION CONTRAST; EXPERIMENTAL PARAMETERS; FIELD-EMISSION TEM; IMAGE SIMULATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCIENTIFIC LITERATURE; SIMULATION METHODS; STEM; STEM DEFECT; TEM; WEAK BEAMS; ZONE AXIS;

DIFFRACTION; IMAGING TECHNIQUES; TRANSMISSION ELECTRON MICROSCOPY;

STACKING FAULTS;

EID: 79956062732     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.547526     Document Type: Article

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