Imaging active topological defects in carbon nanotubes

Nature Nanotechnology

Volumn 2, Issue 6, 2007, Pages 358-360

  Suenaga, Kazu ^a   Wakabayashi, Hideaki ^a   Koshino, Masanori ^a   Sato, Yuta ^a   Urita, Koki ^a   Iijima, Sumio ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN SITU PROCESSING; NANOTUBES; PLASTIC DEFORMATION; TOPOLOGY; YARN;

ATOMIC SENSITIVITY; ATOMISTIC MECHANISM; DISLOCATION CORE; DISLOCATION MOTION; IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM); STONE-WALES TRANSFORMATION; TEM OBSERVATIONS; TOPOLOGICAL DEFECT;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBE;

ARTICLE; IMAGING; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34249946998     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2007.141     Document Type: Article

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