Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy

Ultramicroscopy

Volumn 109, Issue 9, 2009, Pages 1114-1120

  Zhang, Zaoli ^a   Kaiser, Ute ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

Ceramic; High resolution electron microscopy; Si3N4; Spherical aberration corrector

Indexed keywords

CERAMIC; CONTRAST DETAIL; FREE PARAMETERS; LINEAR IMAGING; NITROGEN ATOM; OBJECTIVE LENS; PHASE IMAGING; SI3N4; SIX-MEMBERED RINGS; SPHERICAL ABERRATION COEFFICIENTS; SPHERICAL ABERRATIONS; SPHERICAL-ABERRATION CORRECTOR; STRUCTURAL IMAGING; TRANSMISSION ELECTRON MICROSCOPE;

ABERRATIONS; ATOMS; CERAMIC MATERIALS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; SILICON; SPHERES; SULFUR COMPOUNDS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

SILICON NITRIDE;

ARTICLE; CHEMICAL STRUCTURE; CONTROLLED STUDY; CRYSTAL STRUCTURE; MOLECULAR IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 67650538920     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.04.004     Document Type: Article

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