Aplanatic imaging systems for the transmission electron microscope

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 645, Issue 1, 2011, Pages 20-27

  Müller, Heiko ^a   Maßmann, Ingo ^a   Uhlemann, Stephan ^a   Hartel, Peter ^a   Zach, Joachim ^a   Haider, Maximilian ^a  

^a CEOS Corrected Electron Optical Systems GmbH   (Germany)

Author keywords

Aberration correctors; Off axial coma; Spherical aberration; Transmission electron microscope

Indexed keywords

ABERRATION CORRECTORS; FIELD OF VIEWS; HIGH RESOLUTION; OFF-AXIAL COMA; OPTICAL PERFORMANCE; PROTOTYPE INSTRUMENT; SPHERICAL ABERRATION; SPHERICAL ABERRATIONS; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING SYSTEMS; SPHERES; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 79958223030     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.12.091     Document Type: Conference Paper

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