Effect of mesoscale crystalline structure on the field-effect mobility of regioregular poly(3-hexyl thiophene) in thin-film transistors

Advanced Functional Materials

Volumn 15, Issue 4, 2005, Pages 671-676

  Yang, Hoichang ^a,d   Shin, Tae Joo ^c   Yang, Lin ^c   Cho, Kilwon ^d   Ryu, Chang Y ^a   Bao, Zhenan ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b Stanford University   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; CRYSTAL ORIENTATION; DIFFERENTIAL SCANNING CALORIMETRY; EVAPORATION; MORPHOLOGY; THERMOANALYSIS; THIN FILM TRANSISTORS; TOLUENE; X RAY DIFFRACTION;

CHARGE-CARRIER MOBILITIES; FIELD-EFFECT MOBILITY; PETRI DISH; REGIOREGULAR POLY(3-HEXYL THIOPHENE) (R R P3HT);

CRYSTAL STRUCTURE;

EID: 17144417264     PISSN: 1616301X     EISSN: None     Source Type: Journal    
DOI: 10.1002/adfm.200400297     Document Type: Article

References (36)

1. A. J. Lovinger, L. J. Rothberg, J. Mater. Res. 1996, 11, 1581.
2. H. E. Katz, J. Mater. Chem. 1997, 7, 369.
3. F. Garnier, R. Hajlaoui, A. Yassar, P. Strivastava, Science 1994, 265, 1684.
4. A. Tsumura, H. Koezuka, T. Ando, Appl. Phys. Lett. 1986, 49, 1210.
5. H. Koezuka, A. Tsumura, T. Ando, Synth. Met. 1987, 18, 699.
6. J. Paloheimo, P. Kuivalainen, H. Stubb, E. Vuorimaa, P. Y. Lahti, Appl. Phys. Lett. 1990, 56, 157.
7. K. Yoshino, H. Takahashi, K. Muro, Y. Ohmori, R. Sugimoto, J. Appl. Phys. 1991, 70, 5035.
8. Y. Ohmori, K. Muro, M. Uchida, T. Kawai, K. Yoshino, Jpn. J. Appl. Phys. 1991, 30, L610.
9. A. Assadi, C. Svensson, M. Willander, O. Inganas, Appl. Phys. Lett. 1988, 53, 195.
10. A. R. Brown, A. Pomp, C. M. Hart, D. M. de Leeuw, Science 1995, 270, 972.
11. H. Fuchigami, A. Tsumura, H. Koezuka, Appl. Phys. Lett. 1993, 63, 1372.
12. Z. Bao, A. Dodabalapur, A. J. Lovinger, Appl. Phys. Lett. 1996, 69, 4108.
13. H. E. Katz, Z. Bao, J. Phys. Chem. B 2000, 104, 671.
14. T. Yamamoto, D. Komarudin, M. Arai, B. Lee, H. Suganuma, N. Asa-kawa, Y. Inoue, K. Kubota, S. Sasaki, T. Fukuda, H. Matsuda, J. Am. Chem. Soc. 1998, 120, 2047.
15. Z. Bao, Y. Feng, A. Dodabalapur, V. R. Raju, A. J. Lovinger, Chem. Mater. 1997, 9, 1299.
16. S. Masubuchi, S. Kazama, Synth. Met. 1995, 74, 151.
17. H. Sirringhaus, P. J. Brown, R. H. Friend, M. M. Nielsen, K. Bechgaard, B. M. W. Langeveld-Voss, A. J. H. Spiering, R. A. J. Janssen, E. W. Meijer, P. Herwig, D. M. de Leeuw, Nature 1999, 401, 685.
18. R. J. Kline, E. N. Kadnikova, J. Liu, J. M. J. Frechet, M. D. McGehee, Adv. Mater. 2003, 15, 1519.
19. J. Chang, B. Sun, D. W. Breiby, M. M. Nielsen, T. I. Soiling, M. Giles, I. McCulloch, H. Sirringhaus, Chem. Mater. 2004, 16, 4772.
20. M. Kobashi, H. Takeuchi, Macromolecules 1998, 31, 7273.
21. J. Liu, E. Sheina, T. Kowalewski, R. D. McCullough, Angew. Chem. Int. Ed. 2002, 41, 329.
22. S. Malik, A. K. Nandi, J. Polym. Sci., Part B: Polym. Phys. 2002, 40, 2073.
23. S. Z. D. Cheng, B. Wanderlich, Macromolecules 1988, 21, 3327.
24. S. Z. D. Cheng, Macromolecules 1988, 21, 2475.
25. G. W. Heffner, D. S. Pearson, Macromolecules 1991, 24, 6295.
26. H. Meng, J. Zhang, A. J. Lovinger, B. Wang, P. G. V. Patten, Z. Bao, Chem. Mater. 2003, 15, 1778.
27. S. M. Sze, in Physics of Semiconductor Devices, Wiley, New York 1981.
28. 3, bp: 61 °C, vp: 159 mmHg (at 20 °C)); tetrahydrofuran (THF, bp: 65 °C, vp: 129 mmHg (at 20 °C)); toluene (bp: 110 °C, vp: 47 mmHg (at 20 °C)
29. H. Yang, T. J. Shin, C. Y. Ryu, Z. Bao, manuscript in preparation.
30. G. Horowitz, Adv. Mater. 1998, 10, 365.
31. T. W. Kelley, C. D. Frisbie, J. Phys. Chem. B 2001, 105, 4538.
32. D. Beljonne, J. Cornil, H. Sirringhaus, P. J. Brown, M. Shkunov, R. H. Friend, J. L. Bredas, Adv. Funct. Mater. 2001, 11, 229.
33. X. M. Jiang, R. Österbacka, O. Korovyanko, C. P. An, B. Horovitz, R. A. J. Janssen, Z. V. Vardeny, Adv. Funct. Mater. 2002, 12, 587.
34. M. T. Wang, H. G. Braun, E. Meyer, Macromolecules 2004, 37, 437.
35. G. Reither, J. U. Sommer, J. Chem. Phys. 2000, 112, 4376.
36. J. U. Sommer, G. Reither, J. Chem. Phys. 2000, 112, 4384.