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Volumn 6, Issue 1, 2012, Pages

Wafer-scale fabrication of high-aspect ratio nanochannels based on edge-lithography technique

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; LITHOGRAPHY; REACTIVE ION ETCHING; SILICON WAFERS; WSI CIRCUITS;

EID: 84859329902     PISSN: 19321058     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3683164     Document Type: Article
Times cited : (8)

References (33)
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    • Han, J.1    Craighead, H.G.2
  • 18
    • 23644452355 scopus 로고    scopus 로고
    • 10.1039/b502809d
    • Mao P. Han J. Lab Chip 2005, 5(8):837. 10.1039/b502809d.
    • (2005) Lab Chip , vol.5 , Issue.8 , pp. 837
    • Mao, P.1    Han, J.2
  • 22
    • 59649103650 scopus 로고    scopus 로고
    • 10.1039/b809370a
    • Mao P. Han J. Lab Chip 2009, 9(4):586. 10.1039/b809370a.
    • (2009) Lab Chip , vol.9 , Issue.4 , pp. 586
    • Mao, P.1    Han, J.2
  • 25
    • 0035906180 scopus 로고    scopus 로고
    • 10.1002/1521-4095(200104)13:8<>1.0.CO;2-7
    • Love J.C. Paul K.E. Whitesides G.M. Adv. Mater. 2001, 13(8):604. 10.1002/1521-4095(200104)13:8<>1.0.CO;2-7.
    • (2001) Adv. Mater. , vol.13 , Issue.8 , pp. 604
    • Love, J.C.1    Paul, K.E.2    Whitesides, G.M.3
  • 30
    • 84911500147 scopus 로고    scopus 로고
    • Pattern transfer with additive techniques
    • (CRC LLC, New York)
    • Madou M.J. Pattern transfer with additive techniques. Fundamentals of Microfabrication 1997, 92. in (CRC LLC, New York), p.
    • (1997) Fundamentals of Microfabrication , pp. 92
    • Madou, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.