Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM's

IEEE Electron Device Letters

Volumn 21, Issue 6, 2000, Pages 310-312

  Satoh, S ^a   Tosaka, Y ^a   Wender, S A ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL GEOMETRY; COSMIC RAYS; NEUTRONS;

SOFT ERROR (SE) PHENOMENA;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0033737766     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.843160     Document Type: Article

References (10)

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