Spatial variation of the number of graphene layers formed on the scratched 6H-SiC(0 0 0 1) surface

Applied Surface Science

Volumn 258, Issue 10, 2012, Pages 4672-4677

  Osaklung, J ^a,b   Euaruksakul, C ^c,d   Meevasana, W ^a,c,d   Songsiriritthigul, P ^a,c,d  

^a SURANAREE UNIVERSITY OF TECHNOLOGY   (Thailand)

^b KASETSART UNIVERSITY   (Thailand)

^c SYNCHROTRON LIGHT RESEARCH INSTITUTE   (Thailand)

^d Thailand Ministry of Science and Technology   (Thailand)

Author keywords

Epitaxial graphene; Low energy electron microscopy; SiC; Substrate scratch

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; SILICON CARBIDE;

ELECTRON ENERGIES; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; IMAGE INTENSITIES; LOW ENERGY ELECTRON MICROSCOPY; SMOOTH SUBSTRATES; SPATIAL CONTROL; SPATIAL VARIATIONS;

GRAPHENE;

EID: 84857922120     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.01.059     Document Type: Article

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