Image potential states as a quantum probe of graphene interfaces

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Bose, Sangita ^a   Silkin, Vyacheslav M ^b,c,d   Ohmann, Robin ^a   Brihuega, Ivan ^a   Vitali, Lucia ^a   Michaelis, Christian H ^a   Mallet, Pierre ^e   Veuillen, Jean Yves ^e   Alexander Schneider, M ^f   Chulkov, Evgueni V ^b,c,g   Echenique, Pedro M ^b,c,g   Kern, Klaus ^a,h  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^c UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

^e CNRS   (France)

^f UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^g CENTRO MIXTO CSIC UPV EHU   (Spain)

^h EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; BAND GAPS; BAND STRUCTURE CALCULATION; BI-LAYER; DOUBLE SERIES; EPITAXIAL GRAPHENE; EXPERIMENTAL MEASUREMENTS; GRAPHENES; IMAGE POTENTIAL STATE; IMAGE-POTENTIAL; INTERFACIAL COUPLINGS; POTENTIAL WELLS; QUANTUM PROBE; RYDBERG SERIES; SCANNING TUNNELING SPECTROSCOPY; THREE-DIMENSIONAL SOLIDS;

GRAPHENE; PROBES; RYDBERG STATES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE; SPECTROSCOPY; THREE DIMENSIONAL;

GRAPHITE;

EID: 77649133447     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/2/023028     Document Type: Article

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