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International Journal of Materials Research

Volumn 103, Issue 2, 2012, Pages 179-183

X-ray phase contrast and fluorescence nanotomography for material studies

(6) Suhonen, Heikki a Xu, Feng b Helfen, Lukas b Ferrero, Claudio a Vladimirov, Pavel b Cloetens, Peter a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

Author keywords

Beryllium pebble; Laminography; Nano imaging; Tomography

Indexed keywords

COMPUTED LAMINOGRAPHY; COMPUTED TOMOGRAPHY; ELEMENTAL COMPOSITIONS; EUROPEAN SYNCHROTRON RADIATION FACILITIES; FLUORESCENCE TOMOGRAPHY; LAMINOGRAPHY; LENGTH SCALE; MACROSCOPIC PROPERTIES; NANO-IMAGING; NANO-SCALE IMAGING; NANOPOROSITY; NANOTOMOGRAPHY; NON DESTRUCTIVE; OXIDE INCLUSION; PHASE CONTRASTS; PROJECTION MICROSCOPY; SCANNING PROBES; STRUCTURAL FEATURE; THREE DIMENSIONAL IMAGING; X RAY PHASE CONTRAST; X-RAY ENERGIES;

BERYLLIUM; COMPUTERIZED TOMOGRAPHY; MATERIALS PROPERTIES; OPTICAL TOMOGRAPHY; TOMOGRAPHY;

X RAYS;

EID: 84857544709 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: 10.3139/146.110664 Document Type: Article

Times cited : (13)

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