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Volumn 82, Issue 6, 2011, Pages

On the implementation of computed laminography using synchrotron radiation

(9) Helfen, L a Myagotin, A a,b Mikulk, P c Pernot, P a,e Voropaev, A b Elyyan, M a Di Michiel, M d Baruchel, J d Baumbach, T a

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b ST PETERSBURG STATE UNIVERSITY OF CIVIL AVIATION (Russian Federation)

c MASARYK UNIVERSITY (Czech Republic)

d EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

e Karlsruhe Institute of Technology ^* (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D INSPECTION; COMPUTED LAMINOGRAPHY; EXPERIMENTAL SETUP; EXTENDED OBJECTS; FLIP CHIP; HARD X RAY; HIGH SENSITIVITY; HIGH SPATIAL RESOLUTION; LATERAL DIMENSION; MICRO-SYSTEM TECHNOLOGIES; MICROMETER SCALE; QUALITY ASSESSMENT; SYNCHROTRON LIGHT; SYNCHROTRON SOURCE; THREE DIMENSIONAL (3-D) IMAGING; WHITE SYNCHROTRON BEAM;

FLIP CHIP DEVICES; SYNCHROTRON RADIATION; THREE DIMENSIONAL; TOMOGRAPHY;

SYNCHROTRONS;

EID: 79960201142 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3596566 Document Type: Article

Times cited : (94)

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