Impact of scaling of dielectric thickness on mobility in top-contact pentacene organic thin film transistors

Journal of Applied Physics

Volumn 111, Issue 3, 2012, Pages

  Kumar Singh, Vinay ^a   Mazhari, Baquer ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; BAND MOBILITY; CROSS-LINKABLE; DIELECTRIC ROUGHNESS; DIELECTRIC SURFACE; DIELECTRIC THICKNESS; FIELD-EFFECT MOBILITIES; GATE VOLTAGES; INTERFACE QUALITY; MICROSCOPIC ANALYSIS; ORGANIC THIN FILM TRANSISTORS; PENTACENES; POLY(4-VINYLPHENOL); POLYMER DIELECTRICS; TOP CONTACT;

DIELECTRIC DEVICES; ELECTRIC FIELDS; GATE DIELECTRICS; THIN FILM TRANSISTORS;

DIELECTRIC MATERIALS;

EID: 84857418830     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3681809     Document Type: Article

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