Accurate characterization of organic thin film transistors in the presence of gate leakage current

AIP Advances

Volumn 1, Issue 4, 2011, Pages

  Singh, Vinay K ^a   Mazhari, Baquer ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; LEAKAGE CURRENTS; THIN FILM CIRCUITS; THIN FILMS;

CONVENTIONAL MEASUREMENTS; GATE-LEAKAGE CURRENT; MEASUREMENT TECHNIQUES; NUMERICAL DEVICE SIMULATION; ON/OFF CURRENT RATIO; ORGANIC THIN FILM TRANSISTORS; TRANSFER CHARACTERISTICS; TRANSISTOR CHARACTERISTICS;

THIN FILM TRANSISTORS;

EID: 84855306478     PISSN: None     EISSN: 21583226     Source Type: Journal    
DOI: 10.1063/1.3657786     Document Type: Article

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