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Volumn 24, Issue 8, 2012, Pages

Relation between the chemical force and the tunnelling current in atomic point contacts: A simple model

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; CHEMICAL FORCES; ELECTRONIC LEVELS; INTERACTION ENERGIES; INTERACTION PROCESS; SCALING REGIMES; THEORETICAL MODELS; TIP-SAMPLE DISTANCE; TUNNELLING CURRENT; TWO PARAMETER;

EID: 84857204162     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/8/084001     Document Type: Article
Times cited : (12)

References (48)
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    • Mingo N et al 1996 Phys. Rev. B 54 2225
    • (1996) Phys. Rev. , vol.54 , Issue.3 , pp. 2225
    • Mingo, N.1
  • 38
    • 35949012329 scopus 로고
    • Lang N D 1988 Phys. Rev. B 37 10395
    • (1988) Phys. Rev. , vol.37 , Issue.17 , pp. 10395
    • Lang, N.D.1
  • 44
    • 0000018507 scopus 로고
    • Ortega J et al 1994 Phys. Rev. B 50 10516
    • (1994) Phys. Rev. , vol.50 , Issue.15 , pp. 10516
    • Ortega, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.