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Volumn 11, Issue 12, 2011, Pages 10824-10828

Fabrication and characterization of silicon quantum dots in Si-rich silicon carbide films

Author keywords

HRTEM; Raman shift; Silicon carbide films; Silicon quantum dots

Indexed keywords

ANNEALING TEMPERATURES; ATOM RATIO; FIRST ORDER; GLANCING ANGLE X-RAY DIFFRACTIONS; HIGH-DENSITY; HRTEM; LOWER FREQUENCIES; MAGNETRON CO-SPUTTERING; RAMAN SHIFT; SILICON CARBIDE FILMS; SILICON QUANTUM DOTS; THERMAL CRYSTALLIZATION;

EID: 84857159847     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.4025     Document Type: Conference Paper
Times cited : (6)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.