Effects of sample topography and thermal features in scanning thermal conductivity microscopy

Solid State Communications

Volumn 145, Issue 7-8, 2008, Pages 389-391

  Sarid, Dror ^a   Khulbe, Pramod ^a   Grover, Ranjan ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

C. Thermal microscopy; D. Thermomechanical effect

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SURFACE TOPOGRAPHY; THERMAL CONDUCTIVITY;

MAXWELL AND SHARVIN COMPONENTS; THERMAL MICROSCOPY; THERMOMECHANICAL EFFECT;

ATOMIC FORCE MICROSCOPY;

EID: 38349112312     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.11.028     Document Type: Article

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