Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

Optical Engineering

Volumn 51, Issue 1, 2012, Pages

  Harvey, James E ^a   Schrder, Sven ^b   Choi, Narak ^a   Duparr, Angela ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

bidirectional reflectance distribution function; BRDF; PSD; relevant band limited roughness; scattering from rough surfaces; surface power spectral density function; surface scatter; TIS; total integrated scatter

Indexed keywords

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTIONS; BRDF; PSD; SCATTERING FROM ROUGH SURFACES; SURFACE POWER SPECTRAL DENSITY FUNCTION; SURFACE SCATTER; TIS; TOTAL INTEGRATED SCATTERS; SURFACE POWER;

ARTIFICIAL INTELLIGENCE; DISTRIBUTION FUNCTIONS; FLUIDIZED BEDS; FREQUENCY BANDS; INTEGRATION; OPTICAL CORRELATION; SURFACE MEASUREMENT; SURFACE SCATTERING;

SURFACE ROUGHNESS;

EID: 84856869815     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.OE.51.1.013402     Document Type: Article

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