Total integrated scattering from transparent substrates in the infrared region: validity of scalar theory

Optical Engineering

Volumn 39, Issue 2, 2000, Pages 478-487

  Lindström, Tomas ^a   Rönnow, Daniel ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b ACREO AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED RADIATION; LIGHT REFLECTION; LIGHT SOURCES; LIGHT TRANSMISSION; REFRACTIVE INDEX; SILICON WAFERS; SUBSTRATES; SURFACE ROUGHNESS; TRANSPARENCY;

INTEGRATING SPHERE; SCALAR SCATTERING THEORY;

LIGHT SCATTERING;

EID: 0342298529     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602386     Document Type: Article

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