Nonlinear detection mechanism in quantitative atomic force microscopy characterization of high-frequency nanoelectromechanical systems

Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 3, 2012, Pages

  Serra García, Marc ^a   Pérez Murano, Francesc ^a   San Paulo, Alvaro ^a  

^a CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84856435297     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.035433     Document Type: Article

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