Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy

Langmuir

Volumn 21, Issue 18, 2005, Pages 8096-8098

  Weeks, Brandon L ^a   Vaughn, Mark W ^a   Deyoreo, James J ^b  

^a Department of Electrical and Computer Engineering   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT IMAGING; KELVIN EQUATION; MENISCUS FORMATION; SPHERICAL GEOMETRY;

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; COMPUTATIONAL GEOMETRY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES;

IMAGING TECHNIQUES;

EID: 24944529929     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0512087     Document Type: Article

References (21)

1. Piner, R. D.; Zhu, J.; Xu, F.; Hong, S.; Mirkin, C. A. Science 1999, 283, 661.
2. Haaheim, J.; Eby, R.; Nelson, M.; Fragala, J.; Rosner, B.; Zhang, H.; Athas, G. Ultramicroscopy 2005, 103, 117.
3. Ginger, D. S.; Zhang, H.; Mirkin, C. A. Angew. Chem.-Int. Ed. 2004, 43, 30.
4. Adamson, A. W.; Gast, A. P. Physical Chemistry of Surfaces; Wiley: New York, 1997.
5. Jang, J. Y.; Schatz, G. C.; Ratner, M. A. Phys. Rev. Lett. 2004, 92, 085504.
6. Sheehan, P. E.; Whitman, L. J. Phys. Rev. Lett. 2002, 88, 15.
7. Xiao, X.; Qian, L. Langmuir 2000, 16, 8153.
8. Jang, J.; Schatz, G. C.; Ratner, M. A. J. Chem. Phys. 2002, 116, 3875.
9. Jang, J.; Schatz, G. C.; Ratner, M. A. Phys. Rev. Lett. 2003, 90, 156104.
10. Jang, J. K.; Schatz, G. C.; Ratner, M. A. J. Chem. Phys. 2004, 120, 1157.
11. Schenk, M.; Füting, M.; Reichelt, R. J. Appl. Phys. 1998, 84, 4880.
12. Now Veeco Instruments, Santa Barbara, CA.
13. Schneegans, M.; Menzel, E. J. Colloid Interface Sci. 1982, 88, 97.
14. Yakubov, G. E.; Vinogradova, O. I.; Butt, H. J. J. Adhesion Sci. Technol. 2000, 14, 1783.
15. Vinogradova, O. I. Langmuir 1998, 14, 2827.
16. Donohue, M. D.; Aranovich, G. L. J. Coll. Interface Sci. 1998, 205, 121.
17. Maeda, N.; Isrealachvili, J. N. J. Phys. Chem. B 2002, 106, 3534.
18. Rozhok, S.; Piner, R.; Mirkin, C. A. J. Phys Chem. B 2003, 107, 751
19. Schwartz, P. V. Langmuir 2002, 18, 4041.
20. Weeks, B. L.; Noy, A.; Miller, A. E.; De Yoreo, J. J. Phys. Rev. Lett. 2002, 88, 255505.
21. Peterson, E. J.; Weeks, B. L.; De Yoreo, J. J.; Schwartz, P. V. J. Phys. Chem. B. 2004, 108, 15206-15210.