Standard test data for estimating peak parameter errors in X-ray photoelectron spectroscopy. III. Errors with different curve-fitting approaches

Surface and Interface Analysis

Volumn 29, Issue 12, 2000, Pages 856-872

  Conny, J M ^a   Powell, C J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; COMPUTER SIMULATION; DATA REDUCTION; ERROR ANALYSIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; STATISTICAL METHODS;

STANDARD TEST DATA (STD);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034507124     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200012)29:12<856::AID-SIA940>3.0.CO;2-8     Document Type: Article

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