Standard test data for estimating peak-parameter errors in X-ray photoelectron spectroscopy. I. Peak binding energies

Surface and Interface Analysis

Volumn 26, Issue 12, 1998, Pages 939-956

  Conny, J M ^a   Powell, C J ^a   Currie, L A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Peak fitting; Reference data; X ray photoelectron spectroscopy; XPS

Indexed keywords

ALGORITHMS; ANALYTIC EQUIPMENT; BINDING ENERGY; CURVE FITTING; DATA REDUCTION; ELECTRON ENERGY LEVELS; FUNCTIONS; INSTRUMENT ERRORS; POLYMERS; POLYNOMIALS;

STANDARD TEST DATA;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032202592     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199811)26:12<939::aid-sia441>3.0.co;2-v     Document Type: Article

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