Standard test data for estimating peak parameter errors in X-ray photoelectron spectroscopy: II. Peak intensities

Surface and Interface Analysis

Volumn 29, Issue 7, 2000, Pages 444-459

  Conny, J M ^a   Powell, C J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ERROR ANALYSIS; MATHEMATICAL MODELS; POLYNOMIALS;

POISSON NOISE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034227559     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200007)29:7<444::AID-SIA888>3.0.CO;2-M     Document Type: Article

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