Materials, processing, and testing of flexible image sensor arrays

IEEE Design and Test of Computers

Volumn 28, Issue 6, 2011, Pages 16-22

  Wong, William ^a   Ng, Tse Nga ^b   Sambandan, Sanjiv ^c   Chabinyc, Michael ^d  

^a UNIVERSITY OF WATERLOO   (Canada)

^b PALO ALTO RESEARCH CENTER   (United States)

^c INDIAN INSTITUTE OF SCIENCE   (India)

^d University of California   (United States)

Author keywords

charge map testing; design and test; flexible electronics; sensor arrays

Indexed keywords

DESIGN AND TEST; FLEXIBLE DEVICE; FLEXIBLE SENSOR ARRAY; LARGE AREA DISPLAY; SMART HOMES;

AUTOMATION; FLEXIBLE ELECTRONICS; INTELLIGENT BUILDINGS; MATERIALS TESTING; SENSOR ARRAYS;

FLEXIBLE DISPLAYS;

EID: 84855647648     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2011.94     Document Type: Article

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