Defect identification in large area electronic backplanes

IEEE/OSA Journal of Display Technology

Volumn 5, Issue 1, 2009, Pages 27-33

  Sambandan, Sanjiv ^a,b   Apte, Raj B ^a,b   Wong, William S ^b   Lujan, Rene ^b   Young, Michael ^b   Russo, Beverly ^b   Ready, Steve ^b   Street, Robert A ^b  

^a IEEE   (United States)

^b PALO ALTO RESEARCH CENTER   (United States)

Author keywords

Amorphous silicon; Backplanes; Defects; Testing; Thin film transistor (TFT)

Indexed keywords

ACTIVE MATRIX (AM); BACKPLANES; DEFECT IDENTIFICATION; FEEDTHROUGH; LARGE AREAS; SWITCHED CAPACITOR (SC); TESTING; THIN-FILM TRANSISTOR (TFT);

DEFECTS; PIXELS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; THIN FILM TRANSISTORS; TRANSISTORS;

AMORPHOUS SILICON;

EID: 58449102450     PISSN: 1551319X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JDT.2008.2004858     Document Type: Article

References (6)

1. R. A. Street, Technology and Applications of Amorphous Silicon. Berlin, Germany: Springer, 2000, vol. 37.
2. W. S. Wong, T. Ng, M. Chabinyc, R. Lujan, R. B. Apte, S. Limb, and R. Street, "Flexible a-Si:H-based image sensors fabricated by digital lithography," presented at the MRS Spring Meeting, San Francisco, CA, 2007.
3. R. B. Apte, R. A. Street, S. E. Ready, D. Jared, A. J. Moore, R. L. Weisfield, T. A., and T. Granberg, "Large-area, low-noise amorphous silicon imaging system," in Proc. SPIE Electron. Imag., San Jose, 1998.
4. R. J. Yarema, T. Zimmerman, J, Srage, L. E. Antonuk, J, Berry, W. Huang, and M. Maolinbay, "A probrammable, low noise, multichannel ASIC for readout of pixilated amorphous silicon arrays," Nucl. Instrum. and Methods in Phy. Res. A, vol. 439, pp. 413-417, 2000.
5. B. Sheu, J.-H. Shieh, and M. Patil, "Modeling charge injection in MOS analog switches," IEEE Trans. Circuits Syst., vol. CAS-34, no. 2, pp. 214-216, Feb. 1987.
6. G. Wegmann, E. A. Vittoz, and F. Rahali, "Charge injection in analog MOS switches," IEEE J. Solid-State Circuits, vol. SC-22, no. 6, pp. 1091-1097, Dec. 1987.