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Nanoscale

Volumn 4, Issue 2, 2012, Pages 600-606

Conductive scanning probe microscopy of nanostructured Bi 2Te 3

(5) Souier, Tewfik a Li, Guang a Santos, Sergio a Stefancich, Marco a,b Chiesa, Matteo a,b

a KHALIFA UNIVERSITY (United Arab Emirates)

b Massachusetts Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH ANTIMONY TELLURIDE; BULK VALUE; CONDUCTIVE PROBE; ELECTRICAL CONDUCTIVITY; MINIMAL SAMPLE; NANO-STRUCTURED; NANOSIZED GRAINS; P-TYPE; ROOM TEMPERATURE; STRUCTURAL AND ELECTRICAL PROPERTIES; THERMOELECTRIC MATERIAL; THERMOELECTRIC PROPERTIES;

ANTIMONY; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; NANOCOMPOSITES; THERMAL CONDUCTIVITY; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY;

BISMUTH;

BISMUTH; BISMUTH TELLURIDE; NANOMATERIAL; TELLURIUM;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRIC CONDUCTIVITY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; THERMAL CONDUCTIVITY; ULTRASTRUCTURE;

BISMUTH; ELECTRIC CONDUCTIVITY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SURFACE PROPERTIES; TELLURIUM; THERMAL CONDUCTIVITY;

EID: 84855606306 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c1nr11366f Document Type: Article

Times cited : (11)

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