SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 520, Issue 1, 2011, Pages 656-661

Morphology dependent electrical transport behavior in gold nanostructures

(3) Alkhatib, A a Souier, T a Chiesa, M a,b

a KHALIFA UNIVERSITY (United Arab Emirates)

b Massachusetts Institute of Technology (United States)

Author keywords

Electrical transport; Gold; Nanoparticles; Tunneling; Ultra thin films

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CURVE; DIRECT TUNNELING; ELECTRICAL TRANSPORT; ELECTRON TRANSPORT; GOLD FILM; GOLD ISLANDS; GOLD NANOSTRUCTURES; METAL INSULATOR METALS; SIMMONS MODEL; TWO-REGIME; ULTRA-THIN;

ATOMIC FORCE MICROSCOPY; METAL INSULATOR BOUNDARIES; METALLIC FILMS;

GOLD;

EID: 80054036556 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.08.069 Document Type: Article

Times cited : (14)

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