|
Volumn 256, Issue 8, 2010, Pages 2434-2439
|
Local electrical characteristics of passive films formed on stainless steel surfaces by current sensing atomic force microscopy
|
Author keywords
Conducting atomic force microscopy; Passive film; Semiconductor; Stainless steel
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUSTENITE;
ELECTRONIC PROPERTIES;
ENERGY GAP;
FERRITE;
SEMICONDUCTOR MATERIALS;
TOPOGRAPHY;
AUSTENITE GRAIN;
AUSTENITE STAINLESS STEEL;
CONDUCTING ATOMIC FORCE MICROSCOPY;
CURRENT SENSING;
CURRENT SENSING ATOMIC FORCE MICROSCOPIES;
ELECTRICAL CHARACTERISTIC;
PASSIVE FILMS;
STAINLESS STEEL SURFACE;
STAINLESS STEEL;
|
EID: 74149088707
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2009.10.083 Document Type: Article |
Times cited : (47)
|
References (53)
|