-
1
-
-
33846461691
-
Investigating the molecular mechanisms of in-plane mechanochemistry on cantilever arrays
-
DOI 10.1021/ja065222x
-
Watari M., Galbraith J., Lang H. P., Sousa M., Hegner M., Gerber C., Horton M. A., McKendry R. A., Investigating the molecular mechanisms of in-plane mechanochemistry on cantilever arrays Journal of the American Chemical Society 2007 129 3 601 609 (Pubitemid 46147760)
-
(2007)
Journal of the American Chemical Society
, vol.129
, Issue.3
, pp. 601-609
-
-
Watari, M.1
Galbraith, J.2
Lang, H.-P.3
Sousa, M.4
Hegner, M.5
Gerber, C.6
Horton, M.A.7
McKendry, R.A.8
-
2
-
-
31044434687
-
Label free analysis of transcription factors using microcantilever arrays
-
DOI 10.1016/j.bios.2005.07.018, PII S0956566305002423
-
Huber F., Hegner M., Gerber C., Gntherodt H. J., Lang H. P., Label free analysis of transcription factors using microcantilever arrays Biosensors Bioelectronics 2006 21 8 1599 1605 (Pubitemid 43122027)
-
(2006)
Biosensors and Bioelectronics
, vol.21
, Issue.8
, pp. 1599-1605
-
-
Huber, F.1
Hegner, M.2
Gerber, C.3
Guntherodt, H.-J.4
Lang, H.P.5
-
3
-
-
43449126805
-
Label-free detection of DNA hybridization based on hydration-induced tension in nucleic acid films
-
DOI 10.1038/nnano.2008.91, PII NNANO200891
-
Mertens J., Rogero C., Calleja M., Ramos D., Martn-Gago J. A., Briones C., Tamayo J., Label-free detection of DNA hybridization based on hydration-induced tension in nucleic acid films Nature Nanotechnology 2008 3 5 301 307 (Pubitemid 351668057)
-
(2008)
Nature Nanotechnology
, vol.3
, Issue.5
, pp. 301-307
-
-
Mertens, J.1
Rogero, C.2
Calleja, M.3
Ramos, D.4
Martin-Gago, J.A.5
Briones, C.6
Tamayo, J.7
-
4
-
-
18544366562
-
A differential microcantilever-based system for measuring surface stress changes induced by electrochemical reactions
-
DOI 10.1016/j.snb.2004.10.007, PII S0925400504007002
-
Tabard-Cossa V., Godin M., Beaulieu L. Y., Grtter P., A differential microcantilever-based system for measuring surface stress changes induced by electrochemical reactions Sensors and Actuators B 2005 107 1 233 241 (Pubitemid 40655076)
-
(2005)
Sensors and Actuators, B: Chemical
, vol.107
, Issue.1 SPEC. ISS.
, pp. 233-241
-
-
Tabard-Cossa, V.1
Godin, M.2
Beaulieu, L.Y.3
Grutter, P.4
-
5
-
-
62249113545
-
Quantitative time-resolved measurement of membrane protein-ligand interactions using microcantilever array sensors
-
Braun T., Ghatkesar M. K., Backmann N., Grange W., Boulanger P., Letellier L., Lang H. P., Bietsch A., Gerber C., Hegner M., Quantitative time-resolved measurement of membrane protein-ligand interactions using microcantilever array sensors Nature Nanotechnology 2009 4 3 179 185
-
(2009)
Nature Nanotechnology
, vol.4
, Issue.3
, pp. 179-185
-
-
Braun, T.1
Ghatkesar, M.K.2
Backmann, N.3
Grange, W.4
Boulanger, P.5
Letellier, L.6
Lang, H.P.7
Bietsch, A.8
Gerber, C.9
Hegner, M.10
-
6
-
-
7544230375
-
Virus detection using nanoelectromechanical devices
-
Ilic B., Yang Y., Craighead H. G., Virus detection using nanoelectromechanical devices Applied Physics Letters 2004 85 13 2604 2606
-
(2004)
Applied Physics Letters
, vol.85
, Issue.13
, pp. 2604-2606
-
-
Ilic, B.1
Yang, Y.2
Craighead, H.G.3
-
7
-
-
0035852777
-
Origin of nanomechanical cantilever motion generated from biomolecular interactions
-
DOI 10.1073/pnas.031362498
-
Wu G. H., Ji H., Hansen K., Thundat T., Datar R., Cote R., Hagan M. F., Chakraborty A. K., Majumdar A., Origin of nanomechanical cantilever motion generated from biomolecular interactions Proceedings of the National Academy of Sciences of the United States of America 2001 98 4 1560 1564 (Pubitemid 32165538)
-
(2001)
Proceedings of the National Academy of Sciences of the United States of America
, vol.98
, Issue.4
, pp. 1560-1564
-
-
Wu, G.1
Ji, H.2
Hansen, K.3
Thundat, T.4
Datar, R.5
Cote, R.6
Hagan, M.F.7
Chakraborty, A.K.8
Majumdar, A.9
-
8
-
-
0001682658
-
Observation of a chemical reaction using a micromechanical sensor
-
Gimzewski J. K., Gerber C., Meyer E., Schlittler R. R., Observation of a chemical reaction using a micromechanical sensor Chemical Physics Letters 1994 217 5-6 589 594
-
(1994)
Chemical Physics Letters
, vol.217
, Issue.56
, pp. 589-594
-
-
Gimzewski, J.K.1
Gerber, C.2
Meyer, E.3
Schlittler, R.R.4
-
9
-
-
0002438353
-
Thermal analysis using a micromechanical calorimeter
-
Berger R., Gerber C., Gimzewski J. K., Meyer E., Gntherodt H. J., Thermal analysis using a micromechanical calorimeter Applied Physics Letters 1996 69 1 40 42 (Pubitemid 126636523)
-
(1996)
Applied Physics Letters
, vol.69
, Issue.1
, pp. 40-42
-
-
Berger, R.1
Gerber, Ch.2
Gimzewski, J.K.3
Meyer, E.4
Guntherodt, H.J.5
-
10
-
-
33646195837
-
Conformational change of bacteriorhodopsin quantitatively monitored by microcantilever sensors
-
Braun T., Backmann N., Vögtli M., Bietsch A., Engel A., Lang H. P., Gerber C., Hegner M., Conformational change of bacteriorhodopsin quantitatively monitored by microcantilever sensors Biophysical Journal 2006 90 8 2970 2977
-
(2006)
Biophysical Journal
, vol.90
, Issue.8
, pp. 2970-2977
-
-
Braun, T.1
Backmann, N.2
Vögtli, M.3
Bietsch, A.4
Engel, A.5
Lang, H.P.6
Gerber, C.7
Hegner, M.8
-
11
-
-
36549096102
-
Novel optical approach to atomic force microscopy
-
Meyer G., Amer N. M., Novel optical approach to atomic force microscopy Applied Physics Letters 1988 53 12 1045 1047
-
(1988)
Applied Physics Letters
, vol.53
, Issue.12
, pp. 1045-1047
-
-
Meyer, G.1
Amer, N.M.2
-
12
-
-
4243137092
-
An atomic-resolution atomic-force microscope implemented using an optical lever
-
Alexander S., Hellemans L., Marti O., Schneir J., Elings V., Hansma P. K., Longmire M., Gurley J., An atomic-resolution atomic-force microscope implemented using an optical lever Journal of Applied Physics 1989 65 1 164 167
-
(1989)
Journal of Applied Physics
, vol.65
, Issue.1
, pp. 164-167
-
-
Alexander, S.1
Hellemans, L.2
Marti, O.3
Schneir, J.4
Elings, V.5
Hansma, P.K.6
Longmire, M.7
Gurley, J.8
-
13
-
-
33646166953
-
Sub-angstrom conformational changes of a single molecule captured by AFM variance analysis
-
Walther K. A., Brujić J., Li H., Fernández J. M., Sub-angstrom conformational changes of a single molecule captured by AFM variance analysis Biophysical Journal 2006 90 10 3806 3812
-
(2006)
Biophysical Journal
, vol.90
, Issue.10
, pp. 3806-3812
-
-
Walther, K.A.1
Brujić, J.2
Li, H.3
Fernández, J.M.4
-
14
-
-
0026899891
-
A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFM
-
Putman C. A. J., De Grooth B. G., Van Hulst N. F., Greve J., A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFM Ultramicroscopy 1992 4244 1509 1513
-
(1992)
Ultramicroscopy
, vol.4244
, pp. 1509-1513
-
-
Putman, C.A.J.1
De Grooth, B.G.2
Van Hulst, N.F.3
Greve, J.4
-
15
-
-
73549101942
-
Detection sensitivity of the optical beam deflection method characterized with the optical spot size on the detector
-
Lee E. J., Park Y., Kim C. S., Kouh T., Detection sensitivity of the optical beam deflection method characterized with the optical spot size on the detector Current Applied Physics 2010 10 3 834 837
-
(2010)
Current Applied Physics
, vol.10
, Issue.3
, pp. 834-837
-
-
Lee, E.J.1
Park, Y.2
Kim, C.S.3
Kouh, T.4
-
16
-
-
1542641158
-
Noise in optical measurements of cantilever deflections
-
Garcia-Valenzuela A., Villatoro J., Noise in optical measurements of cantilever deflections Journal of Applied Physics 1998 84 1 58 63 (Pubitemid 128559379)
-
(1998)
Journal of Applied Physics
, vol.84
, Issue.1
, pp. 58-63
-
-
Garcia-Valenzuela, A.1
Villatoro, J.2
-
17
-
-
0031211296
-
Limits of different detection schemes used in the optical beam deflection method
-
Garcia-Valenzuela A., Limits of different detection schemes used in the optical beam deflection method Journal of Applied Physics 1997 82 3 985 988 (Pubitemid 127589939)
-
(1997)
Journal of Applied Physics
, vol.82
, Issue.3
, pp. 985-988
-
-
Garcia-Valenzuela, A.1
-
18
-
-
1542677633
-
Calibration of optical cantilever deflection readers
-
Hu Z. Y., Seeley T., Kossek S., Thundat T., Calibration of optical cantilever deflection readers Review of Scientific Instruments 2004 75 2 400 404
-
(2004)
Review of Scientific Instruments
, vol.75
, Issue.2
, pp. 400-404
-
-
Hu, Z.Y.1
Seeley, T.2
Kossek, S.3
Thundat, T.4
-
19
-
-
0035939275
-
Quantitative surface stress measurements using a microcantilever
-
DOI 10.1063/1.1387262
-
Godin M., Tabard-Cossa V., Grtter P., Williams P., Quantitative surface stress measurements using a microcantilever Applied Physics Letters 2001 79 4 551 553 (Pubitemid 33606822)
-
(2001)
Applied Physics Letters
, vol.79
, Issue.4
, pp. 551-553
-
-
Godin, M.1
Tabard-Cossa, V.2
Grutter, P.3
Williams, P.4
-
20
-
-
0001022448
-
Calibration of surface stress measurements with atomic force microscopy
-
Miyatani T., Fujihira M., Calibration of surface stress measurements with atomic force microscopy Journal of Applied Physics 1997 81 11 7099 7115 (Pubitemid 127626643)
-
(1997)
Journal of Applied Physics
, vol.81
, Issue.11
, pp. 7099-7115
-
-
Miyatani, T.1
Fujihira, M.2
-
21
-
-
0029387634
-
Calibration of optical lever sensitivity for atomic force microscopy
-
D'Costa N. P., Hoh J. H., Calibration of optical lever sensitivity for atomic force microscopy Review of Scientific Instruments 1995 66 10 5096 5097
-
(1995)
Review of Scientific Instruments
, vol.66
, Issue.10
, pp. 5096-5097
-
-
D'Costa, N.P.1
Hoh, J.H.2
-
22
-
-
33644530055
-
Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors
-
Beaulieu L. Y., Godin M., Laroche O., Tabard-Cossa V., Grtter P., Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors Applied Physics Letters 2006 88 8 3
-
(2006)
Applied Physics Letters
, vol.88
, Issue.8
, pp. 3
-
-
Beaulieu, L.Y.1
Godin, M.2
Laroche, O.3
Tabard-Cossa, V.4
Grtter, P.5
-
23
-
-
0026898391
-
Force microscopy
-
Binnig G., Force microscopy Ultramicroscopy 1992 4244 7 15
-
(1992)
Ultramicroscopy
, vol.4244
, pp. 7-15
-
-
Binnig, G.1
-
24
-
-
33750306098
-
Atomic force microscope-force mapping and profiling on A sub 100- Å scale
-
Martin Y., Williams C. C., Wickramasinghe H. K., Atomic force microscope-force mapping and profiling on A sub 100-Å scale Journal of Applied Physics 1987 61 10 4723 4729
-
(1987)
Journal of Applied Physics
, vol.61
, Issue.10
, pp. 4723-4729
-
-
Martin, Y.1
Williams, C.C.2
Wickramasinghe, H.K.3
-
25
-
-
34347209835
-
Calculation of thermal noise in atomic force microscopy
-
Butt H. J., Jaschke M., Calculation of thermal noise in atomic force microscopy Nanotechnology 1995 6 1 1 7
-
(1995)
Nanotechnology
, vol.6
, Issue.1
, pp. 1-7
-
-
Butt, H.J.1
Jaschke, M.2
-
26
-
-
0036472312
-
Measuring the spring constant of atomic force microscope cantilevers: Thermal fluctuations and other methods
-
DOI 10.1088/0957-4484/13/1/307, PII S0957448402275984
-
Levy R., Maaloum M., Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods Nanotechnology 2002 13 1 33 37 (Pubitemid 34180677)
-
(2002)
Nanotechnology
, vol.13
, Issue.1
, pp. 33-37
-
-
Levy, R.1
Maaloum, M.2
-
27
-
-
0036609560
-
Device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs
-
Jericho S. K., Jericho M. H., Device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs Review of Scientific Instruments 2002 73 6 2483 2485
-
(2002)
Review of Scientific Instruments
, vol.73
, Issue.6
, pp. 2483-2485
-
-
Jericho, S.K.1
Jericho, M.H.2
-
29
-
-
0001155528
-
Calibration of rectangular atomic force microscope cantilevers
-
Sader J. E., Chon J. W. M., Mulvaney P., Calibration of rectangular atomic force microscope cantilevers Review of Scientific Instruments 1999 70 10 3967 3969 (Pubitemid 129589035)
-
(1999)
Review of Scientific Instruments
, vol.70
, Issue.10
, pp. 3967-3969
-
-
Sader, J.E.1
Chon, J.W.M.2
Mulvaney, P.3
-
30
-
-
0033891144
-
Brownian fluctuation spectroscopy using atomic force microscopes
-
DOI 10.1021/la991059q
-
Ma H. L., Jimenez J., Rajagopalan R., Brownian fluctuation spectroscopy using atomic force microscopes Langmuir 2000 16 5 2254 2261 (Pubitemid 30572963)
-
(2000)
Langmuir
, vol.16
, Issue.5
, pp. 2254-2261
-
-
Ma, H.L.1
Jimenez, J.2
Rajagopalan, R.3
-
31
-
-
0027540056
-
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
-
Cleveland J. P., Manne S., Bocek D., Hansma P. K., A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy Review of Scientific Instruments 1993 64 2 403 405
-
(1993)
Review of Scientific Instruments
, vol.64
, Issue.2
, pp. 403-405
-
-
Cleveland, J.P.1
Manne, S.2
Bocek, D.3
Hansma, P.K.4
-
32
-
-
36449002856
-
Method for the calibration of atomic force microscope cantilevers
-
Sader J. E., Larson I., Mulvaney P., White L. R., Method for the calibration of atomic force microscope cantilevers Review of Scientific Instruments 1995 66 7 3789 3798
-
(1995)
Review of Scientific Instruments
, vol.66
, Issue.7
, pp. 3789-3798
-
-
Sader, J.E.1
Larson, I.2
Mulvaney, P.3
White, L.R.4
-
33
-
-
0000368409
-
Short cantilevers for atomic force microscopy
-
Walters D. A., Cleveland J. P., Thomson N. H., Hansma P. K., Wendman M. A., Gurley G., Elings V., Short cantilevers for atomic force microscopy Review of Scientific Instruments 1996 67 10 3583 3590 (Pubitemid 126569376)
-
(1996)
Review of Scientific Instruments
, vol.67
, Issue.10
, pp. 3583-3590
-
-
Walters, D.A.1
Cleveland, J.P.2
Thomson, N.H.3
Hansma, P.K.4
Wendman, M.A.5
Gurley, G.6
Elings, V.7
-
34
-
-
4544257551
-
Finite optical spot size and position corrections in thermal spring constant calibration
-
Proksch R., Schffer T. E., Cleveland J. P., Callahan R. C., Viani M. B., Finite optical spot size and position corrections in thermal spring constant calibration Nanotechnology 2004 15 9 1344 1350
-
(2004)
Nanotechnology
, vol.15
, Issue.9
, pp. 1344-1350
-
-
Proksch, R.1
Schffer, T.E.2
Cleveland, J.P.3
Callahan, R.C.4
Viani, M.B.5
-
35
-
-
0037259343
-
Comparison of calibration methods for atomic-force microscopy cantilevers
-
Burnham N. A., Chen X., Hodges C. S., Matei G. A., Thoreson E. J., Roberts C. J., Davies M. C., Tendler S. J. B., Comparison of calibration methods for atomic-force microscopy cantilevers Nanotechnology 2003 14 1 1 6
-
(2003)
Nanotechnology
, vol.14
, Issue.1
, pp. 1-6
-
-
Burnham, N.A.1
Chen, X.2
Hodges, C.S.3
Matei, G.A.4
Thoreson, E.J.5
Roberts, C.J.6
Davies, M.C.7
Tendler, S.J.B.8
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