Thermal analysis using a micromechanical calorimeter

Applied Physics Letters

Volumn 69, Issue 1, 1996, Pages 40-42

  Berger, R ^a,b   Gerber, Ch ^a   Gimzewski, J K ^a   Meyer, E ^b   Guntherodt H J ^b  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002438353     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118111     Document Type: Article

References (18)

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17. SiNx = 600 nm.
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