Calibration of optical cantilever deflection readers

Review of Scientific Instruments

Volumn 75, Issue 2, 2004, Pages 400-404

  Hu, Zhiyu ^a   Seeley, Tim ^b   Kossek, Sebastian ^b   Thundat, Thomas ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Protiveris Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL READER SYSTEMS; VERTICAL CAVITY SURFACE-EMITTING LASERS (VCSEL);

ATOMIC FORCE MICROSCOPY; CALIBRATION; CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; ERROR ANALYSIS; MICROELECTROMECHANICAL DEVICES; PH EFFECTS; PHOTOCURRENTS; PIEZOELECTRICITY; SCANNING; SENSITIVITY ANALYSIS; SENSORS;

CANTILEVER BEAMS;

EID: 1542677633     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1637457     Document Type: Article

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