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Volumn 82, Issue 3, 1997, Pages 985-988

Limits of different detection schemes used in the optical beam deflection method

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; LIGHT; MIRRORS; NUMERICAL ANALYSIS; OPTICAL RESOLVING POWER; PERFORMANCE;

EID: 0031211296     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365941     Document Type: Article
Times cited : (16)

References (12)
  • 3
    • 85033179816 scopus 로고    scopus 로고
    • Park Scientific Instruments, Sunnyvale, CA
    • The Autoprobe CP (AFM microscope), Park Scientific Instruments, Sunnyvale, CA.
    • The Autoprobe CP (AFM Microscope)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.