The dielectric relaxation behavior of (Na 0.82K 0.18) 0.5Bi 0.5TiO 3 ferroelectric thin film

Journal of Applied Physics

Volumn 110, Issue 12, 2011, Pages

  Dong, H ^a   Zheng, X J ^a,b   Li, W ^c   Gong, Y Q ^a   Peng, J F ^a   Zhu, Z ^a  

^a XIANGTAN UNIVERSITY   (China)

^b UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY   (China)

^c UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CENTROSYMMETRIC; DEBYE-LIKE RELAXATION; DEPOLARIZATION TEMPERATURE; DIELECTRIC CONSTANTS; DIELECTRIC PERMITTIVITIES; DIELECTRIC RELAXATION BEHAVIOR; DIFFUSED PHASE TRANSITION; METAL ORGANIC DECOMPOSITION; MICRO ELECTRO MECHANICAL SYSTEM; PARAELECTRIC PHASE; PHENOMENOLOGICAL EQUATIONS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC THIN FILM DEVICES; POLAR NANOREGIONS; POTENTIAL APPLICATIONS; REMNANT POLARIZATIONS; RESONANCE PEAK; SPACE CHARGE POLARIZATION; SPONTANEOUS POLARIZATIONS; TEMPERATURE DEPENDENCE; TEMPERATURE SPECTRA; TIO; WORKING TEMPERATURES;

BISMUTH; CURIE TEMPERATURE; DECOMPOSITION; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; FERROELECTRIC THIN FILMS; FERROELECTRICITY; MICROELECTROMECHANICAL DEVICES; ORGANOMETALLICS; PERMITTIVITY; PHASE TRANSITIONS; PIEZOELECTRICITY; POLARIZATION; POTASSIUM; SODIUM; THIN FILM DEVICES;

THIN FILMS;

EID: 84855336176     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665389     Document Type: Article

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