Nanoscale study by piezoresponse force microscopy of relaxor 0.7Pb(Mg 1/3Nb2/3)O3-0.3PbTiO3 and 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3 thin films grown on platinum and LaNiO3 electrodes

Thin Solid Films

Volumn 518, Issue 16, 2010, Pages 4670-4674

  Detalle, M ^a,b   Ferri, A ^c   Da Costa, A ^a   Desfeux, R ^a   Soyer, C ^d   Remiens D ^d  

^a UNIVERSITÉ D'ARTOIS   (France)

^b CEA LETI   (France)

^c UNIVERSITY OF GRONINGEN   (Netherlands)

^d INSTITUT D ELECTRONIQUE   (France)

Author keywords

Atomic force microscopy; Nanoscale investigations; Piezoelectric effect; Relaxor PMN PT thin films

Indexed keywords

BOTTOM ELECTRODES; COERCIVE FIELD; ELECTROMECHANICAL ACTIVITY; LANTHANUM NICKELATE; MACRO SCALE; MACROSCOPIC MEASUREMENTS; NANO DOMAIN; NANO SCALE; NANOSCALE LEVELS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC EFFECT; PIEZOELECTRIC HYSTERESIS LOOPS; PIEZORESPONSE FORCE MICROSCOPY; PMN-PT FILM; RANDOM FIELDS; RELAXOR PMN-PT THIN FILMS; RELAXORS; REMNANT POLARIZATIONS; RF-SPUTTERING; SWITCHING PROPERTIES;

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; ELECTRODES; GRAIN BOUNDARIES; HYSTERESIS; HYSTERESIS LOOPS; LEAD; NANOSTRUCTURED MATERIALS; PLATINUM; POLARIZATION; THIN FILMS; VAPOR DEPOSITION;

PIEZOELECTRICITY;

EID: 77955629585     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.12.056     Document Type: Conference Paper

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