Piezoelectric property in morphotropic phase boundary Bi0.5 (Na0.82 K0.18)0.5 Ti O3 lead free thick film deposited by screen printing

Applied Physics Letters

Volumn 92, Issue 15, 2008, Pages

  Zhang, Haibo ^a   Jiang, Shenglin ^a   Zeng, Yike ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; PHASE TRANSITIONS; SCREEN PRINTING;

PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC THICK FILMS;

PIEZOELECTRICITY;

EID: 42349103575     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2911744     Document Type: Article

References (24)

1. S. P. Beeby, N. Ross, and N. M. White, Electron. Lett. 35, 2060 (1999).
2. T. Morita, M. Kurosawa, and T. Higuchi, Jpn. J. Appl. Phys., Part 1 35, 3251 (1996).
3. T. Yan, B. E. Jones, R. T. Rakowski, M. J. Tudor, S. P. Beeby, and N. M. White, Sens. Actuators, A 115, 401 (2004).
4. N. R. Harris, M. Hill, N. M. White, and S. P. Beeby, Electron. Lett. 40, 636 (2004).
5. S. Wang, K. H. Lam, C. L. Sun, K. W. Kwok, H. L. W. Chan, M. S. Guo, and X. Z. Zhao, Appl. Phys. Lett. 90, 113506 (2007).
6. E. S. Thiele, D. Damjanovic, and N. Setter, J. Am. Ceram. Soc. 84, 2863 (2001).
7. H. D. Chen, K. R. Udayakumar, L. E. Cross, J. J. Bernstein, and L. C. Niles, J. Appl. Phys. 77, 3349 (1995).
8. A. Navarro, J. R. Alcock, and R. W. Whatmore, J. Eur. Ceram. Soc. 24, 1073 (2004).
9. R. A. Dorey and R. W. Whatmore, J. Eur. Ceram. Soc. 24, 1091 (2004).
10. W. J. Tseng, S. Y. Lin, and S. R. Wang, J. Electroceram. 16, 537 (2006).
11. J. Ryu, J.-J. Choi, B.-D. Hahn, D.-S. Park, W.-H. Yoon, and K.-H. Kim, Appl. Phys. Lett. 90, 152901 (2007).
12. Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, and M. Nakamura, Nature (London) 432, 84 (2004).
13. F. Remondiere, A. Wu, P. M. Vilarinho, and J. P. Mercurio, Appl. Phys. Lett. 90, 152905 (2007).
14. C.-M. Wang, J.-F. Wang, and Z.-G. Gai, Scr. Mater. 57, 789 (2007).
15. T. Takenaka, K.-I. Maruyama, and K. Sakata, Jpn. J. Appl. Phys., Part 1 30, 2236 (1991).
16. V. A. Isupov, Ferroelectrics 315, 123 (2005).
17. A. Sasaki, T. Chiba, Y. Mamiya, and E. Otsuki, Jpn. J. Appl. Phys., Part 1 38, 5564 (1999).
18. T. Yu, K. W. Kwok, and H. L. W. Chan, Mater. Lett. 61, 2117 (2007).
19. L. Simon, S. Le Dren, and P. Gonnard, J. Eur. Ceram. Soc. 21, 1441 (2001).
20. H. Banno, Am. Ceram. Soc. Bull. 66, 1332 (1987).
21. H. Nagata, M. Yoshida, Y. Makiuchi, and T. Takenaka, Jpn. J. Appl. Phys., Part 1 42, 7401 (2003).
22. D. Damjanovic, J. Appl. Phys. 82, 1788 (1997).
23. R. N. Torah, S. P. Beeby, and N. M. White, J. Phys. D 37, 1074 (2004).
24. X. X. Wang, X. G. Tang, and H. L. W. Chan, Appl. Phys. Lett. 85, 91 (2004).