Dielectric spectroscopy measurements of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD

Ferroelectrics

Volumn 302, Issue , 2004, Pages 313-318

  Craciun, F ^a   Dinescu, M ^b   Verardi, P ^a   Scarisoreanu, N ^b   Galassi, C ^c   Piazza, D ^c  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

^c INSTITUTE OF SCIENCE AND TECHNOLOGY FOR CERAMICS   (Italy)

Author keywords

Dielectric spectroscopy; PLZT; RF PLD; Thin films

Indexed keywords

DIELECTRIC RELAXATION; INTERFACES (MATERIALS); MEASUREMENT THEORY; PERMITTIVITY; PULSED LASER DEPOSITION; SPECTROSCOPIC ANALYSIS;

DIELECTRIC SPECTROSCOPY; PLZT; RELAXOR FERROELECTRICS; RF-PLD;

FERROELECTRIC THIN FILMS;

EID: 15244364177     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190490456286     Document Type: Article

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