Direct mapping of ionic transport in a Si anode on the nanoscale: Time domain electrochemical strain spectroscopy study

ACS Nano

Volumn 5, Issue 12, 2011, Pages 9682-9695

  Jesse, Stephen ^a   Balke, Nina ^a   Eliseev, Eugene ^b   Tselev, Alexander ^a   Dudney, Nancy J ^a   Morozovska, Anna N ^b   Kalinin, Sergei V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b INSTITUTE OF HYDROBIOLOGY   (Ukraine)

Author keywords

lithium ion; Si anode; time domain electrochemical strain microscopy

Indexed keywords

CONDUCTIVITY MEASUREMENTS; DIRECT MAPPING; ELECTROCHEMICAL STRAIN; ELECTROCHEMICAL SYSTEMS; IONIC TRANSPORTS; LITHIUM IONS; NANO SCALE; NANO-METER SCALE; SIGNAL FORMATION; TIME DOMAIN;

IONIC CONDUCTION; LITHIUM; SILICON;

AMORPHOUS SILICON;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODE; EQUIPMENT; EQUIPMENT DESIGN; ION TRANSPORT; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE; YOUNG MODULUS;

DIELECTRIC SPECTROSCOPY; ELASTIC MODULUS; ELECTRODES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; ION TRANSPORT; MATERIALS TESTING; NANOSTRUCTURES; PARTICLE SIZE; SILICON; SURFACE PROPERTIES;

EID: 84555223749     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn203141g     Document Type: Article

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