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Volumn 19, Issue 1, 2007, Pages 81-94

Nanoscale characterization of polycrystalline ferroelectric materials for piezoelectric applications

Author keywords

Ferroelectricity; Local properties; Piezoelectricity; Piezoresponse force microscopy; Relaxors

Indexed keywords

FERROELECTRICITY; LEAD COMPOUNDS; MEMS; PIEZOELECTRICITY; POLYCRYSTALLINE MATERIALS;

EID: 34848910513     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-007-9045-2     Document Type: Article
Times cited : (46)

References (47)
  • 6
    • 2942646512 scopus 로고    scopus 로고
    • M. Alexe, A. Gruverman (ed.) (Springer, Berlin Heidelberg New York
    • M. Alexe, A. Gruverman (ed.), Nanoscale Characterization of Ferroelectric Materials (Springer, Berlin Heidelberg New York, 2004)
    • (2004) Nanoscale Characterization of Ferroelectric Materials


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.