Spatially resolved imaging of inhomogeneous charge transfer behavior in polymorphous molybdenum oxide. I. Correlation of localized structural, electronic, and chemical properties using conductive probe atomic force microscopy and Raman microprobe spectroscopy

Langmuir

Volumn 21, Issue 8, 2005, Pages 3521-3528

  McEvoy, Todd M ^a,b   Stevenson, Keith J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b AIR PRODUCTS AND CHEMICALS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE PROBE ATOMIC FORCE MICROSCOPY (CP-AFM); LITHIUM INSERTION OXIDES; RAMAN MICROPROBE SPECTROSCOPY; SPATIALLY RESOLVED IMAGING;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; DEFECTS; ELECTRIC CONDUCTIVITY; FERMI LEVEL; LITHIUM COMPOUNDS; POSITIVE IONS; RAMAN SPECTROSCOPY; SINTERING; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

MOLYBDENUM COMPOUNDS;

EID: 17544366175     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la047276v     Document Type: Article

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