Historical trend in alpha-particle induced soft error rates of the alpha™ microprocessor

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2001, Pages 259-265

  Seifert, N ^a   Moyer, D ^a   Leland, N ^a   Hokinson, R ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

Alpha particle; Core logic; Duty cycle; Latch; Reliability; SER; SEU; Soft error; SRAM

Indexed keywords

ALPHA PARTICLES; BIT ERROR RATE; ELECTRON DEVICE MANUFACTURE; RANDOM ACCESS STORAGE; RELIABILITY;

CORE LOGIC; DUTY CYLE; MEMORY CELLS; SOFT ERROR RATES;

MICROPROCESSOR CHIPS;

EID: 0035004322     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Alpha-particle-induced soft errors in dynamic memories
2. IBM experiments in soft fails in computer electronics (1978-1994)
3. A new failure mode of radiation-induced soft errors in dynamic memories
4. Calculation of the soft error rate of submicron CMOS logic circuits
5. Neutron-induced soft error simulator and its accurate predictions
6. Alpha-SER modeling & simulation for Sub-0.25 mm CMOS technologies
7. Methods for reducing soft errors in deep submicron integrated circuits
8. Soft error considerations for deep-submicron CMOS circuit applications
9. Circuit design concepts
10. Circuit simulations of alpha-particle-induced soft errors in MOS dynamic RAM's
11. Product soft error rates based on accelerated test procedure called out in Mil-STD-883D