Neutron-induced 10B fission as a major source of soft errors in high density SRAMs

Microelectronics Reliability

Volumn 41, Issue 2, 2001, Pages 211-218

  Baumann, Robert C ^a   Smith, Eric B ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOROSILICATE GLASS; ERROR ANALYSIS; FISSION REACTIONS; NEUTRON ABSORPTION;

COSMIC NEUTRONS; SOFT ERROR RATE EVENTS;

RANDOM ACCESS STORAGE;

EID: 0035127652     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00218-3     Document Type: Article

References (14)

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